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Accelerating yield improvement: Root cause analysis in semiconductor manufacturing

November 18, 2025 by JP Richard-Charman

Semiconductor manufacturing is one of the most complex production environments in the world. Each wafer passes through hundreds of tightly controlled process steps, with thousands of variables that can influence yield and quality. Even minor deviations in temperature, pressure, or chemical composition can lead to costly defects, delayed deliveries, and lost revenue. In this … [Read more...] about Accelerating yield improvement: Root cause analysis in semiconductor manufacturing

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