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Manufacturing

Uncover hidden process signals and drive better decisions with Spotfire Statistica®

April 16, 2026 by Dan Rope

With the release of Spotfire® 14.8 (also available for Spotfire 14.6.2 LTS and later), we continue to significantly expand the toolkit for industrial analytics. An additional 23 advanced, no-code algorithms, powered by the deep analytical engine of Spotfire Statistica®, have been added to our library of built-in data functions. This expansion builds upon the foundation of … [Read more...] about Uncover hidden process signals and drive better decisions with Spotfire Statistica®

How Renesas uses Spotfire® to unlock smarter semiconductor manufacturing

March 16, 2026 by Petra Cady

What happens when billions of data points meet real-time analytics and engineering creativity? For Renesas, the result is a competitive edge. In the high-stakes world of semiconductor manufacturing, speed and precision aren’t optional; they’re existential. Global fab operations generate vast volumes of data every second, and every wafer, every zone, and every test carries … [Read more...] about How Renesas uses Spotfire® to unlock smarter semiconductor manufacturing

Your wafer tells you exactly where the process failed

February 24, 2026 by Alessandro Chimera

The semiconductor industry is currently drowning in data and starving for answers. Every wafer produced contains millions of die-level measurements that reveal exactly where processes fail, which tools are drifting, and why yields are stagnating. The pain is that most fabs are still reading this story backwards, after the damage is done, through manual inspection workflows … [Read more...] about Your wafer tells you exactly where the process failed

Accelerating yield improvement: Root cause analysis in semiconductor manufacturing

November 18, 2025 by JP Richard-Charman

Semiconductor manufacturing is one of the most complex production environments in the world. Each wafer passes through hundreds of tightly controlled process steps, with thousands of variables that can influence yield and quality. Even minor deviations in temperature, pressure, or chemical composition can lead to costly defects, delayed deliveries, and lost revenue. In this … [Read more...] about Accelerating yield improvement: Root cause analysis in semiconductor manufacturing

Revolutionizing manufacturing with Spotfire®: Transformative insights from Renesas Electronics

October 29, 2025 by JP Richard-Charman

How do industry titans harness the power of advanced analytics to maintain their competitive edge in critical sectors such as semiconductor manufacturing? This question took center stage in our most recent webinar, which was presented with Renesas Electronics, which illuminated how cutting-edge data-centric tools and innovative methodologies are reshaping the manufacturing … [Read more...] about Revolutionizing manufacturing with Spotfire®: Transformative insights from Renesas Electronics

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Uncover hidden process signals and drive better decisions with Spotfire Statistica®

April 16, 2026

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April 8, 2026

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