In high-tech manufacturing, location is never just position; it’s process context. Wafers, dies, equipment, process steps, inspection points, and defects all exist in spatial relationships. Understanding how these elements interact is critical for improving yield, diagnosing variability, and optimizing production performance. Yet many mapping capabilities available in … [Read more...] about Mapping your insights: Spatial analytics for high-tech manufacturing with Spotfire® Industry Pro
Manufacturing
Uncover hidden process signals and drive better decisions with Spotfire Statistica®
With the release of Spotfire® 14.8 (also available for Spotfire 14.6.2 LTS and later), we continue to significantly expand the toolkit for industrial analytics. An additional 23 advanced, no-code algorithms, powered by the deep analytical engine of Spotfire Statistica®, have been added to our library of built-in data functions. This expansion builds upon the foundation of … [Read more...] about Uncover hidden process signals and drive better decisions with Spotfire Statistica®
How Renesas uses Spotfire® to unlock smarter semiconductor manufacturing
What happens when billions of data points meet real-time analytics and engineering creativity? For Renesas, the result is a competitive edge. In the high-stakes world of semiconductor manufacturing, speed and precision aren’t optional; they’re existential. Global fab operations generate vast volumes of data every second, and every wafer, every zone, and every test carries … [Read more...] about How Renesas uses Spotfire® to unlock smarter semiconductor manufacturing
Your wafer tells you exactly where the process failed
The semiconductor industry is currently drowning in data and starving for answers. Every wafer produced contains millions of die-level measurements that reveal exactly where processes fail, which tools are drifting, and why yields are stagnating. The pain is that most fabs are still reading this story backwards, after the damage is done, through manual inspection workflows … [Read more...] about Your wafer tells you exactly where the process failed
Accelerating yield improvement: Root cause analysis in semiconductor manufacturing
Semiconductor manufacturing is one of the most complex production environments in the world. Each wafer passes through hundreds of tightly controlled process steps, with thousands of variables that can influence yield and quality. Even minor deviations in temperature, pressure, or chemical composition can lead to costly defects, delayed deliveries, and lost revenue. In this … [Read more...] about Accelerating yield improvement: Root cause analysis in semiconductor manufacturing