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Accelerating yield improvement: Root cause analysis in semiconductor manufacturing

November 18, 2025 by JP Richard-Charman

Semiconductor manufacturing is one of the most complex production environments in the world. Each wafer passes through hundreds of tightly controlled process steps, with thousands of variables that can influence yield and quality. Even minor deviations in temperature, pressure, or chemical composition can lead to costly defects, delayed deliveries, and lost revenue.

In this high-stakes environment, the ability to quickly detect, diagnose, and resolve production issues is critical. Yet, many manufacturers still rely on manual analysis and fragmented data sources, making it difficult to uncover the true root causes of yield loss.

Our Spotfire® Data Science data sheet series, focuses on key use cases within Energy (Oil & Gas) and Manufacturing (Semiconductor Manufacturing). This semiconductor manufacturing-focused data sheet is part of a three-part series showcasing how Spotfire Data Science helps industries unlock the full potential of their data, driving efficiency, reducing risk, and building a foundation for predictive, intelligent operations.

In this first data sheet of the series focused on the semiconductor manufacturing sector, specifically, root cause analysis for quality and performance improvement. This data sheet explores how manufacturers can transform vast amounts of process and inspection data into actionable insight.

With Spotfire Data Science, engineering teams can unify data from wafer maps, process logs, defect inspections, and test results into a single analytical environment. Advanced analytics and interactive visualizations reveal subtle correlations that traditional methods often miss—helping teams quickly identify the factors behind yield excursions and take corrective action.

By connecting the dots across the production process, Spotfire empowers semiconductor organizations to:

  • Detect and resolve yield issues faster
  • Reduce scrap and rework
  • Improve product quality and process stability
  • Boost profitability and customer confidence

From identifying hidden process deviations to uncovering the upstream causes of defects, Spotfire turns complex wafer data into clear, actionable insights—driving continuous performance improvement across the fab.

Read the data sheet now.

Ready to explore more? Start your free trial now. The Spotfire Data Science trial gives you the freedom to explore your data and gain faster insights for complex problem-solving. Start unlocking full-circle insights in Spotfire Data Science today. 

Categories: Industry Innovation, Manufacturing, Visual Data Science Tags: manufacturing, root cause analysis, Spotfire® Data Science

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