Yield and Defect: DecisionSite Helps Engineers to Ramp Yield Faster
DecisionSite allows yield and defect engineers to ramp yield faster and improve analysis methods for next generation technologies.DecisionSite gives yield engineers the flexibility to explore and understand production drivers that are often only revealed through analysis of combined in-line, lot history, functional, electrical, and bitmap data. Defect engineers can maximize the value of inspection data, images and spectra to prioritize and quickly resolve yield excursions and develop methodology to avoid them in the future. Models of device behavior can be distributed widely for iterative validation of design assumptions as process technologies evolve.
"Texas Instruments chose DecisionSite to help our engineers make higher confidence and higher quality decisions faster, while continuously improving our methods for future technology generations. The faster TI's engineers can analyze data, the faster we get high yielding products to market, giving us better margins and market share gains against slower competitors."
- Joe Lebowitz, Director, Yield and Product Engineering, Texas Instruments Kilby Research Center
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